Produzione scientifica
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Filtri: Autore is Quirini, A. and Parola Chiave is Zinc sulfide [Clear All Filters]
Characterisation of ZnS:Mn thin films by Rietveld refinement of Bragg-Brentano X-ray diffraction patterns,
, Thin Solid Films, Volume 353, Number 1, p.129-136, (1999)