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Filtri: Autore is Galluzzi, F. and Parola Chiave is Spectroscopic analysis [Clear All Filters]
Critical analysis of the determination of the density of defects in a-Si1-xGex alloys with the PDS technique,
, Conference Record of the IEEE Photovoltaic Specialists Conference, Volume 1, Las Vegas, NV, USA, p.212-217, (1988)